History

1987

  • The company was founded in 1987 and was the exclusive agent of Mitutoyo for Linear Scale products. Sister company is King Scholar Trading Co., Ltd.

1993

  • Successfully developed Digital Readout products and started to develop Linear Scale products.

1997

  • Both Linear Scale and Digital Readout products had passed DNV and EMC testing and granted CE standard approval.

1999

  • Cooperated with Industrial Technology Research Institutes for Scanning Probe Microscope (SPM) Project Development. Our company granted ISO9002 approval at the same time.

2000

  • Cooperated with Industrial Technology Research Institutes for development Precision Profile Projector and Image Measuring System.

2001

  • Cooperated with the Center for Measurement Standards of the Industrial Technology Research Institutes for Open Linear Scale Project Development.

2002

  • Open Linear Scale technical skill transferred completed.

2003

  • Cooperated with the Center for Measurement Standards of the Industrial Technology Research Institutes for SPM project to produce AMF prototype module. Applying the Length Calibration Accredited Laboratory of the Chinese National Laboratory Accreditation (CNLA).

2004

  • Developed successfully the first CNC Video Measuring System.

2005

  • Special IC with patent for Digital readout with linear compensation function; CNC Coordinate Measuring Machine with air bearings and CMM software are successfully released.

2006

  • Cooperated with Industrial Technology Research Institutes for development of White-light Scanning Interferometer.

2007

  • Main products are CE approved.

2008

  • Release the Auto-focus function for Video Measuring Machine and 3D Optical Profiler.

2009

  • Develop absolute linear scale.

2010

  • From this year Carmar's Laboratory could issue an official certificate for customers.

2011

  • Cooperate with calibration laboratory: Government class calibration laboratory.

2012

  • Developed successfully the Mirau interfere lens.

2013

  • Absolute encoder is under development.

2014

  • Non-contact Film Thickness Measuring Module/ Equipment.

2015

  • Entering the field of semi-conductor.

2024

  • Large Field of View Image VMM (quick check) Software and Hardware presentation.
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